GROWTH AND CHARACTERIZATION OF CALCIUM FLOURIDE (CaF2) THIN FILMS

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ABSTRACT

Semi-conductor thin films of Calcium Flouride (CaF2), were successfully deposited on glass substrates at room temperature, using improved solution growth technique (SGT) at different bath concentration. Absorbance Spectra (A) data were measured by a 7565 UV-VIS Spectrophotometer at wavelength range from 340nm to 980nm. Other optical properties and solid-state properties of the films were computed from the data and compared with the other deposited thin film. Average optical and solid-state properties include: absorbance (A) = 0.006 – 0.019, transmittance (T) = 0.9863 – 0.9572, Reflectance(R) = 0.0077 – 0.0238, absorbing power (α) = 0.0691 x 106 m -1 – 0.3845 x 106 m -1 , Refractive index (n) = 1.4743 – 2.2796, Film thickness (t) = 2.6667 – 1.0100 and bandgap (Eg) = 1.88 – 1.73eV.the films produced with refractive index lower than 1.9 could be useful in anti-reflection coatings, window coatings, eyeglass coatings, solar thermal control coatings etc. while those with refractive index greater than 1.9 could be useful in construction of poultry houses, anti-dazzling coatings, solar cells, etc. The deposited films having band gap (Eg) within light energy range (= 1.5 – 3.0eV) of electromagnetic spectrum could find application in solar electricity for rural electrification, telecommunication, remote monitoring and control systems.

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